Stéphane Moreau
Search for a job in reliability of electronic components
Grenoble, France
Stéphane Moreau | English | French |
Schools attended |
Université Tours Francois Rabelais (Polytech Tours) |
Université Tours Francois Rabelais (IUT - GEII) |
Since 2006: CEA |
Post-doc
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Post-doctoral position at the Back-End Laboratory of the CEA-LETI (Grenoble, France). - Reliability of copper interconnects (nodes beyond 65 nm) under thermo-electrical stress: test setting up (LabVIEW), tests (influence of geometry, materials…), lifetime estimation and failure mechanism determination. - Development of a finite element model in order to understand the adhesive and cohesive ruptures appearing during the Chemical-Mechanical Polishing (CMP) step and to find solutions to reduce the stress state of the system. => Implementation under ANSYS of the Virtual Crack Closure Technique (VCCT) for the Energy Release Rate (ERR) calculus (fracture mechanics). | |
Sector: Electronics and microelectronics |
2006 : Power Microelectronics Laboratory (Laboratoire de Microélectronique de Puissance, LMP) |
Research engineer
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Power Microelectronics Laboratory (Laboratoire de Microélectronique de Puissance, LMP – Tours, France) - Thermo-mechanical simulations of 3D capacitors (DIOS, FLOOPS, ANSYS) to understand the cracks appearing during manufacturing process. - Modal and electro-structural analyses (ANSYS) for MEMS for medical imaging. - Thermo-mechanical characterization (DMA method) of Pb-Sb-Sn solder. | |
Sector: Electronics and microelectronics |
2001 - 2005 : STMicroelectronics |
PhD student
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PhD with STMicroelectronics and the Power Microelectronics Laboratory (Laboratoire de Microélectronique de Puissance, LMP – Tours, France): “Thermo-mechanical reliability of power electronic devices”. - Comparison of TRIAC reliability according to TCT and TST tests. - Lifetime estimation through statistical analyses (Weibull++ software). - Failure analyses (micro-sections, X-ray, SAM, SEM). - Thermo-mechanical characterization (DTA, TMA, DMA methods) of metals and alloys (especially on solders), epoxy resins and ceramics. - 3-D FE simulations (ANSYS): failure mode establishing (resulting of statistical and failures analyses and simulations), parameters extraction of different lifetime models (strain and energy-based models), lifetime estimation. - In charge of the invitation to tender for a DMA. Supervision of trainees working on ANSYS simulations and/or reliability studies. | |
Sector: Electronics and microelectronics |
Interests |
Climbing (teenagers’ trainer ; federal diploma), mountain bike, running, trekking (Morocco / Kenya / Tanzania...), skiing, windsurfing. |


